The adoption of intraoral scanners in fully digital All-on-X workflows is becoming increasingly common. Although scanner technology has advanced, the accuracy and reliability of full-arch implant scans remain a topic of concern.

Various scanning aids have been introduced, each claiming to enhance scan quality. This lecture aims to explain the principles behind peripheral, radial, and central scan aids, with a particular emphasis on how central scanning can reduce stitching errors.

It will present the clinical steps involved in the ioConnect™ central scanning protocol, TruScan Zone, and provide guidance on how to achieve optimal results. Comparison with the other solutions will be introduced to know what the benefit and merits is of using the ioConnect™.

Additionally, the lecture will introduce a practical approach to digital bite registration for full-arch implant cases.